Publications

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Filters: Author is van Dorssen, G. E.  [Clear All Filters]
1996
H.J Voorma, G.E van Dorssen, E. Louis, N.B Koster, A.D Smith, M.D Roper, F. Bijkerk,  EXAFS measurements on the structure of Mo/Si multilayers produced using ion bombardment and increased deposition temperature, Applied Surface Science 393 (1996) 221-230.
1994
E. Louis, H.J Voorma, N.B Koster, L. Shmaenok, F. Bijkerk, R. Schlatmann, J. Verhoeven, Y.Y Platonov, G.E van Dorssen, H.A Padmore,  Enhancement of Reflectivity of Multilayer Mirrors for Soft-X-Ray Projection Lithography by Temperature Optimization and Ion-Bombardment, Microelectronic Engineering 1-423 (1994) 215-218.
F. Bijkerk, E. Louis, G.E van Dorssen, A.P Shevelko, A.A Vasilyev,  Absolute Brightness of Laser Plasmas in the Soft-X-Ray Emission Band, Applied Optics 133 (1994) 82-88.
1992
G.E van Dorssen, E. Louis, F. Bijkerk,  Optimization of X-Ray-Emission from a Laser-Produced Plasma in a Narrow Wavelength Band, Laser and Particle Beams 410 (1992) 759-765.
1991
E.J Puik, G.E van Dorssen, M.J van der Wiel, J. Verhoeven, G. Vanderlaan, H.A Padmore,  Characterization of the Resolving Power of a Double Multilayer Monochromator in the Energy-Range of 600-900 Ev, Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films 69 (1991) 3142-3148.
1989
H. Vanbrug, G.E van Dorssen, M.J van der Wiel,  Si L-Edge Structures in the Soft-X-Ray Reflectivity of Laser-Annealed Si Surfaces (with Ni Overlayers), Surface Science 1-2210 (1989) 69-84.