Donne, A. J. H., Deheer, F. J., & Olson, R. E. (1989). The Role of Small-Impact-Parameter Electron-Loss Processes on Ion Temperatures Measured by Active-Beam Plasma Diagnostics. Journal of Applied Physics, 65, 57-63. (Original work published)
DIFFER
F. J. Deheer
First name
F.
Middle name
J.
Last name
Deheer
Donne, A. J. H., & Deheer, F. J. (1987). The Role of Charge-Changing Collisions with Impurity Ions in Active-Beam Plasma Diagnostics. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms, 23, 219-221. https://doi.org/10.1016/0168-583x(87)90449-6 (Original work published 2024)
Donne, A. J. H., & Deheer, F. J. (1987). Influence of Highly Charged Impurities on Ion Temperatures Measured with Active-Beam Plasma Diagnostics. Journal of Applied Physics, 62, 780-786. (Original work published)