DIFFER
DIFFER Publication
Influence of Highly Charged Impurities on Ion Temperatures Measured with Active-Beam Plasma Diagnostics
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
1987
|
| Journal |
Journal of Applied Physics
|
| Volume |
62
|
| Number |
3
|
| Number of Pages |
780-786
|
| Date Published |
08/1987
|
| ISBN Number |
0021-8979
|
| PId |
dd3e4de12b12a58b02a42a4ed1170ff2
|
Journal Article
|
|
| Download citation |
Citation
Donne, A. J. H., & Deheer, F. J. (1987). Influence of Highly Charged Impurities on Ion Temperatures Measured with Active-Beam Plasma Diagnostics. Journal of Applied Physics, 62, 780-786. (Original work published 1987)