F. Bijkerk

van der Horst, R. M., Beckers, J. ., Osorio, E. A., Astakhov, D. I., Goedheer, W. J., Lee, C. J., … Banine, V. . (2016). Exploring the electron density in plasma induced by EUV radiation: I. Experimental study in hydrogen. Journal of Physics D: Applied Physics, 49(14), 145203. https://doi.org/10.1088/0022-3727/49/14/145203

Astakhov, D. I., Goedheer, W. J., Lee, C. J., Ivanov, V. V., Krivtsun, V. M., Koshelev, K. N., … Bijkerk, F. . (2016). Exploring the electron density in plasma induced by EUV radiation: II. Numerical studies in argon and hydrogen. Journal of Physics D: Applied Physics, 49(29), 295204. https://doi.org/10.1088/0022-3727/49/29/295204

Zoethout, E. ., Louis, E. ., & Bijkerk, F. . (2016). In depth study of molybdenum silicon compound formation at buried interfaces. Journal of Applied Physics, 120(11), 115303. https://doi.org/10.1063/1.4962541

Astakhov, D. I., Goedheer, W. J., Lee, C. J., Ivanov, V. V., Krivtsun, V. M., Zotovich, A. I., … Bijkerk, F. . (2015). Plasma probe characteristics in low density hydrogen pulsed plasmas. Plasma Sources Science and Technology, 24(5), 055018. https://doi.org/10.1088/0963-0252/24/5/055018

Dolgov, A. ., Lopaev, D. ., Lee, C. J., Zoethout, E. ., Medvedev, V. ., Yakushev, O. ., & Bijkerk, F. . (2015). Characterization of carbon contamination under ion and hot atom bombardment in a tin-plasma extreme ultraviolet light source. Applied Surface Science, 353, 708-713. https://doi.org/10.1016/j.apsusc.2015.06.079 (Original work published)

Medvedev, V. V., Yang, J. ., Schmidt, A. J., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E. ., & Bijkerk, F. . (2015). Anisotropy of heat conduction in Mo/Si multilayers. Journal of Applied Physics, 118(8), 085101. https://doi.org/10.1063/1.4928958

Gao, A. ., Zoethout, E. ., Sturm, J. M., Lee, C. J., & Bijkerk, F. . (2014). Defect formation in single layer graphene under extreme ultraviolet irradiation. Applied Surface Science, 317, 745-751. https://doi.org/10.1016/j.apsusc.2014.08.177 (Original work published 2025)

Gao, A. ., Lee, C. J., & Bijkerk, F. . (2014). Graphene defect formation by extreme ultraviolet generated photoelectrons. Journal of Applied Physics, 116, 054312. https://doi.org/10.1063/1.4892485 (Original work published)

Yakunin, S. N., Makhotkin, I. A., Nikolaev, K. V., van de Kruijs, R. W. E., Chuev, M. A., & Bijkerk, F. . (2014). Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structures. Optics Express, 22(17), 20076–20086. https://doi.org/10.1364/OE.22.020076 (Original work published 2025)

Huang, Q. ., de Boer, M. ., Barreaux, J. ., van der Meer, R. ., Louis, E. ., & Bijkerk, F. . (2014). High efficiency structured EUV multilayer mirror for spectral filtering of long wavelengths. Optics Express, 22(16), 19365-19374. https://doi.org/10.1364/OE.22.019365 (Original work published 2025)