DIFFER

F. Bijkerk

First name
F.
Last name
Bijkerk
Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., von Blanckenhagen, G., Bosgra, J., … Bijkerk, F. (2013). Interlayer growth in Mo/B4C multilayered structures upon thermal annealing. Journal of Applied Physics, 113(14), 144310. https://doi.org/10.1063/1.4800910
Bosgra, J., Veldhuizen, L. W., Zoethout, E., Verhoeven, J., Loch, R. A., Yakshin, A. E., & Bijkerk, F. (2013). Interactions of C in layered Mo-Si structures. Thin Solid Films, 542, 210-213. https://doi.org/10.1016/j.tsf.2013.06.082
Medvedev, V. V., van de Kruijs, R. W. E., Yakshin, A. E., Novikova, N. N., Krivtsun, V. M., Louis, E., … Bijkerk, F. (2013). Multilayer mirror with enhanced spectral selectivity for the next generation extreme ultraviolet lithography. Applied Physics Letters, 103, 221114. https://doi.org/10.1063/1.4837335
Makhotkin, I. A., Zoethout, E., van de Kruijs, R., Yakunin, S. N., Louis, E., Yakunin, A. M., … Bijkerk, F. (2013). Short period La/B and LaN/B multilayer mirrors for similar to 6.8 nm wavelength. Optics Express, 21, 29894-29904. https://doi.org/10.1364/oe.21.029894 (Original work published 2025)
Gao, A., Rizo, P. J., Zoethout, E., Scaccabarozzi, L., Lee, C. J., Banine, V., & Bijkerk, F. (2013). Extreme ultraviolet induced defects on few-layer graphene. Journal of Applied Physics, 114(4), 044313. https://doi.org/10.1063/1.4817082
Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2013). Enhanced thermal stability of extreme ultraviolet multilayers by balancing diffusion-induced structural changes. Applied Physics Letters, 103(9), 093105. https://doi.org/10.1063/1.4819851
van der Meer, R., Kozhevnikov, I., Krishnan, B., Huskens, J., Hegeman, P., Brons, C., … Bijkerk, F. (2013). Single-order operation of lamellar multilayer gratings in the soft x-ray spectral range. AIP Advances, 3, 012103. https://doi.org/10.1063/1.4774297
Zoethout, E., Louis, E., & Bijkerk, F. (2013). Real-space insight in the nanometer scale roughness development during growth and ion beam polishing of molybdenum silicon multilayer films. Applied Surface Science, 285, Part B, 293-299. https://doi.org/http://dx.doi.org/10.1016/j.apsusc.2013.08.053
Sturm, J. M., Lee, C. J., & Bijkerk, F. (2013). Reactions of ethanol on Ru(0001). Surface Science, 612, 42-47. https://doi.org/10.1016/j.susc.2013.02.009
van den Boogaard, A. J. R., van Goor, F. A., Louis, E., & Bijkerk, F. (2012). Wavelength separation from extreme ultraviolet mirrors using phaseshift reflection. Optics Letters, 37, 160-162. https://doi.org/10.1364/OL.37.000160 (Original work published 2025)