DIFFER

R. W. E. van de Kruijs

First name
R.
Middle name
W. E.
Last name
van de Kruijs
Medvedev, V. V., Yang, J. ., Schmidt, A. J., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E. ., & Bijkerk, F. . (2015). Anisotropy of heat conduction in Mo/Si multilayers. Journal of Applied Physics, 118(8), 085101. https://doi.org/10.1063/1.4928958
Yakunin, S. N., Makhotkin, I. A., Nikolaev, K. V., van de Kruijs, R. W. E., Chuev, M. A., & Bijkerk, F. . (2014). Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structures. Optics Express, 22(17), 20076–20086. https://doi.org/10.1364/OE.22.020076 (Original work published 2024)
Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Chuev, M. A., Pashaev, E. ., Zoethout, E. ., … Kovalchuk, M. V. (2014). Model independent X-ray standing wave analysis of periodic multilayer structures. Journal of Applied Physics, 115(13), 134303. https://doi.org/10.1063/1.4869540 (Original work published)
Huber, S. P., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E. ., Boller, K.-J. ., & Bijkerk, F. . (2014). Subwavelength single layer absorption resonance antireflection coatings. Optics Express, 22, 490–497. https://doi.org/10.1364/OE.22.000490 (Original work published 2024)
Sobierajski, R. ., Loch, R. A., van de Kruijs, R. W. E., Louis, E. ., von Blanckenhagen, G. ., Gullikson, E. M., … Bijkerk, F. . (2013). Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources. Journal of Synchrotron Radiation, 20, 249-257. https://doi.org/10.1107/s0909049512049990 (Original work published 2024)
Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E. ., von Blanckenhagen, G. ., Bosgra, J. ., … Bijkerk, F. . (2013). Interlayer growth in Mo/B4C multilayered structures upon thermal annealing. Journal of Applied Physics, 113(14), 144310. https://doi.org/10.1063/1.4800910
Medvedev, V. V., van de Kruijs, R. W. E., Yakshin, A. E., Novikova, N. N., Krivtsun, V. M., Louis, E. ., … Bijkerk, F. . (2013). Multilayer mirror with enhanced spectral selectivity for the next generation extreme ultraviolet lithography. Applied Physics Letters, 103, 221114. https://doi.org/10.1063/1.4837335
Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. . (2013). Enhanced thermal stability of extreme ultraviolet multilayers by balancing diffusion-induced structural changes. Applied Physics Letters, 103(9), 093105. https://doi.org/10.1063/1.4819851
Bruijn, S. ., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. . (2012). Ion assisted growth of B4C diffusion barrier layers in Mo/Si multilayered structures. Journal of Applied Physics, 111(6), 064303. https://doi.org/10.1063/1.3693992 (Original work published 2024)
Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E. ., & Bijkerk, F. . (2012). Thermally induced interface chemistry in Mo/B4C/Si/B4C multilayered films. Journal of Applied Physics, 112(5), 054317. https://doi.org/10.1063/1.4751029 (Original work published 2024)