R. W. E. van de Kruijs

Bosgra, J., Verhoeven, J., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2012). Non-constant diffusion characteristics of nanoscopic Mo-Si interlayer growth. Thin Solid Films, 522, 228–232. https://doi.org/10.1016/j.tsf.2012.08.051

Medvedev, V. V., Yakshin, A. E., van de Kruijs, R. W. E., Krivtsun, V. M., Yakunin, A. M., Koshelev, K. N., & Bijkerk, F. (2012). Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectors. Optics Letters, 37(7), 1169-1171. https://doi.org/10.1364/OL.37.001169 (Original work published 2025)

Bosgra, J., Zoethout, E., van der Eerden, A. M. J., Verhoeven, J., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2012). Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors. Applied Optics, 51, 8541-8548. https://doi.org/10.1364/AO.51.008541 (Original work published)

Makhotkin, I. A., Louis, E., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., . Y. Seregin, A., … Bijkerk, F. (2011). Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves. Physica Status Solidi A-Applications and Materials Science, 208, 2597-2600. https://doi.org/10.1002/pssa.201184256 (Original work published 2025)

Loch, R. A., Dubrouil, A., Sobierajski, R., Descamps, D., Fabre, B., Lidon, P., … Mairesse, Y. (2011). Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. Optics Letters, 36(17), 3386-3388. https://doi.org/10.1364/OL.36.003386 (Original work published 2025)

Medvedev, V. V., Yakshin, A. E., van de Kruijs, R. W. E., Krivtsun, V. M., Yakunin, A. M., Koshelev, K. N., & Bijkerk, F. (2011). Infrared suppression by hybrid EUV multilayer-IR etalon structures. Optics Letters, 36(17), 3344-3346. https://doi.org/10.1364/OL.36.003344 (Original work published 2025)

Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2011). In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films. Applied Surface Science, 257(7), 2707-2711. https://doi.org/0.1016/j.apsusc.2010.10.049 (Original work published 2025)

de Rooij-Lohmann, V., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Kleyn, A. W., Keim, E. G., … Bijkerk, F. (2010). Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics, 108, 5. Retrieved from <Go to ISI>://000280000400090 (Original work published 2025)

Kuznetsov, A. S., van de Kruijs, R. W. E., Gleeson, M. A., Schmid, K., & Bijkerk, F. (2010). Hydrogen interaction with EUVL-relevant optical materials. Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques, 4, 563-566. Retrieved from <Go to ISI>://000280703600002 (Original work published 2025)

de Rooij-Lohmann, V., Veldhuizen, L. W., Zoethout, E., Yakshin, A. E., van de Kruijs, R. W. E., Thijsse, B. J., … Bijkerk, F. (2010). Chemical interaction of B4C, B, and C with Mo/Si layered structures. Journal of Applied Physics, 108, 6. Retrieved from <Go to ISI>://000284270900129 (Original work published 2025)