R. W. E. van de Kruijs

Tsarfati, T., van de Kruijs, R. W. E., Zoethout, E., Louis, E., & Bijkerk, F. (2010). Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics. Thin Solid Films, 518, 7249-7252. Retrieved from <Go to ISI>://000282915100017 (Original work published 2025)

Khorsand, A. R., Sobierajski, R., Louis, E., Bruijn, S., van Hattum, E. D., van de Kruijs, R. W. E., … Bijkerk, F. (2010). Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express, 18, 700-712. Retrieved from <Go to ISI>://000273860400032 (Original work published 2025)

Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., & Bijkerk, F. (2010). Thermally induced decomposition of B4C barrier layers in Mo/Si multilayer structures. Surface & Coatings Technology, 205, 2469-2473. Retrieved from <Go to ISI>://000286343100091 (Original work published 2025)

Nedelcu, I., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2009). Microstructure of Mo/Si multilayers with B4C diffusion barrier layers. Applied Optics, 48, 155-160. Retrieved from <Go to ISI>://000262994200001 (Original work published 2025)

Gou, F., Gleeson, M. A., Kleyn, A. W., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2009). Growth of silicon nitride films by bombarding amorphous silicon with N+ ions: MD simulation. Elsevier Science Bv. Retrieved from <Go to ISI>://000271349500070

Tsarfati, T., Zoethout, E., van de Kruijs, R. W. E., & Bijkerk, F. (2009). Atomic O and H exposure of C-covered and oxidized d-metal surfaces. Surface Science, 603, 2594-2599. Retrieved from <Go to ISI>://000269415500036 (Original work published 2025)

Nedelcu, I., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2007). Temperature-dependent nanocrystal formation in Mo/Si multilayers. Physical Review B, 76. Retrieved from <Go to ISI>://000251986600085 (Original work published 2025)

van de Kruijs, R. W. E., Zoethout, E., Yakshin, A. E., Nedelcu, I., Louis, E., Enkisch, H., … Bijkerk, F. (2006). Nano-size crystallites in Mo/Si multilayer optics. Thin Solid Films, 515, 430-433. Retrieved from <Go to ISI>://000241220600011 (Original work published 2025)