DIFFER
DIFFER Publication
Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems
| Label | Value |
|---|---|
| Author | |
| Abstract |
The effect of an amorphous-to-nanocrystalline phase transition on the diffusion across an interface layer of subnanometer thickness has been investigated in real-time. The diffusion in the Mo/B4C/Si thin film structure studied was found to instantaneously enhance by an order of magnitude upon the formation of nanocrystals inducing the atomic-scale onset of grain boundary diffusion. (C) 2010 American Institute of Physics. [doi:10.1063/1.3460107] |
| Year of Publication |
2010
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| Journal |
Journal of Applied Physics
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| Volume |
108
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| Number |
1
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| Number of Pages |
5
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| Date Published |
07/2010
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| Type of Article |
Article
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| ISBN Number |
0021-8979
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| Accession Number |
ISI:000280000400090
|
| URL | |
| PId |
128f55f14f334efd6272008864237968
|
| Alternate Journal |
J. Appl. Phys.
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Journal Article
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|
| Download citation |
Citation
de Rooij-Lohmann, V., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Kleyn, A. W., Keim, E. G., … Bijkerk, F. (2010). Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics, 108, 5. Retrieved from <Go to ISI>://000280000400090 (Original work published 2010)