Vita de Rooij-Lohmann

de Rooij-Lohmann, V., Yakshin, A. E., Zoethout, E., Verhoeven, J., & Bijkerk, F. (2011). Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection. Applied Surface Science, 257(14), 6251-6255. https://doi.org/10.1016/j.apsusc.2011.02.054 (Original work published 2025)

de Rooij-Lohmann, V., Kozhevnikov, I. V., Peverini, L., Ziegler, E., Cuerno, R., Bijkerk, F., & Yakshin, A. E. (2010). Roughness evolution of Si surfaces upon Ar ion erosion. Applied Surface Science, 256, 5011-5014. Retrieved from <Go to ISI>://000276929600026 (Original work published 2025)

de Rooij-Lohmann, V., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Kleyn, A. W., Keim, E. G., … Bijkerk, F. (2010). Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics, 108, 5. Retrieved from <Go to ISI>://000280000400090 (Original work published 2025)

de Rooij-Lohmann, V. (2010). Nanoscale diffusion, compound formation and phase transitions in Mo/Si multilayer structures (University of Twente). University of Twente, Enschede, Netherlands. Retrieved from http://doc.utwente.nl/73280/ (Original work published)

de Rooij-Lohmann, V., Veldhuizen, L. W., Zoethout, E., Yakshin, A. E., van de Kruijs, R. W. E., Thijsse, B. J., … Bijkerk, F. (2010). Chemical interaction of B4C, B, and C with Mo/Si layered structures. Journal of Applied Physics, 108, 6. Retrieved from <Go to ISI>://000284270900129 (Original work published 2025)