I. Nedelcu

Nedelcu, I. ., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. . (2009). Microstructure of Mo/Si multilayers with B4C diffusion barrier layers. Applied Optics, 48, 155-160. Retrieved from <Go to ISI>://000262994200001 (Original work published 2025)

Nedelcu, I. ., van de Kruijs, R. ., Yakshin, A. E., von Blanckenhagen, G. ., & Bijkerk, F. . (2008). Reflectivity and surface roughness of multilayer-coated substrate recovery layers for EUV lithographic optics. Optical Engineering, 47, 5. Retrieved from <Go to ISI>://000257884800009 (Original work published 2025)

Nedelcu, I. ., de Kruijs, R. ., Yakshin, A. E., & Bijkerk, F. . (2008). Thermally enhanced interdiffusion in Mo/Si multilayers. Journal of Applied Physics, 103, 6. Retrieved from <Go to ISI>://000255456200080 (Original work published 2025)

Nedelcu, I. ., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. . (2007). Temperature-dependent nanocrystal formation in Mo/Si multilayers. Physical Review B, 76. Retrieved from <Go to ISI>://000251986600085 (Original work published 2025)

Nedelcu, I. . (2007). Interface structure and interdiffusion in Mo/Si multilayers (University of Twente). University of Twente, Enschede, Netherlands. Retrieved from http://doc.utwente.nl/57926/ (Original work published 2007)

van de Kruijs, R. W. E., Zoethout, E. ., Yakshin, A. E., Nedelcu, I. ., Louis, E. ., Enkisch, H. ., … Bijkerk, F. . (2006). Nano-size crystallites in Mo/Si multilayer optics. Thin Solid Films, 515, 430-433. Retrieved from <Go to ISI>://000241220600011 (Original work published 2025)

Nedelcu, I. ., de Kruijs, R. ., Yakshin, A. E., Tichelaar, F. ., Zoethout, E. ., Louis, E. ., … Bijkerk, F. . (2006). Interface roughness in Mo/Si multilayers. Thin Solid Films, 515, 434-438. Retrieved from <Go to ISI>://000241220600012 (Original work published 2025)