DIFFER
DIFFER Publication
Interface roughness in Mo/Si multilayers
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
2006
|
| Journal |
Thin Solid Films
|
| Volume |
515
|
| Number |
2
|
| Number of Pages |
434-438
|
| Date Published |
10/2006
|
| ISBN Number |
0040-6090
|
| Accession Number |
ISI:000241220600012
|
| URL | |
| PId |
cfbd7a5a12dc2776e8859dd049441c38
|
Journal Article
|
|
| Download citation |
Citation
Nedelcu, I., van de Kruijs, R. W., Yakshin, A. E., Tichelaar, F., Zoethout, E., Louis, E., … Bijkerk, F. (2006). Interface roughness in Mo/Si multilayers. Thin Solid Films, 515, 434-438. Retrieved from <Go to ISI>://000241220600012 (Original work published 2006)