Rwev de Kruijs

Sobierajski, R., Bruijn, S., Khorsand, A. R., Louis, E., de Kruijs, R., Burian, T., … Bijkerk, F. (2011). Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express, 19(1), 193-205. https://doi.org/10.1364/OE.19.000193 (Original work published 2025)

Tsarfati, T., de Kruijs, R., Zoethout, E., Louis, E., & Bijkerk, F. (2009). Reflective multilayer optics for 6.7 nm wavelength radiation sources and next generation lithography. Thin Solid Films, 518, 1365-1368. Retrieved from <Go to ISI>://000272861500002 (Original work published 2025)

van Herpen, M., de Kruijs, R., Klunder, D. J. W., Louis, E., Yakshin, A. E., Alonso van der Westen, S., … Banine, V. (2008). Spectral-purity-enhancing layer for multilayer mirrors. Optics Letters, 33, 560-562. Retrieved from <Go to ISI>://000254907500010 (Original work published 2025)

Nedelcu, I., de Kruijs, R., Yakshin, A. E., & Bijkerk, F. (2008). Thermally enhanced interdiffusion in Mo/Si multilayers. Journal of Applied Physics, 103, 6. Retrieved from <Go to ISI>://000255456200080 (Original work published 2025)

Nedelcu, I., de Kruijs, R., Yakshin, A. E., Tichelaar, F., Zoethout, E., Louis, E., … Bijkerk, F. (2006). Interface roughness in Mo/Si multilayers. Thin Solid Films, 515, 434-438. Retrieved from <Go to ISI>://000241220600012 (Original work published 2025)