C. J. Lee

van der Horst, R. M., Beckers, J. ., Osorio, E. A., Astakhov, D. I., Goedheer, W. J., Lee, C. J., … Banine, V. . (2016). Exploring the electron density in plasma induced by EUV radiation: I. Experimental study in hydrogen. Journal of Physics D: Applied Physics, 49(14), 145203. https://doi.org/10.1088/0022-3727/49/14/145203

Astakhov, D. I., Goedheer, W. J., Lee, C. J., Ivanov, V. V., Krivtsun, V. M., Koshelev, K. N., … Bijkerk, F. . (2016). Exploring the electron density in plasma induced by EUV radiation: II. Numerical studies in argon and hydrogen. Journal of Physics D: Applied Physics, 49(29), 295204. https://doi.org/10.1088/0022-3727/49/29/295204

Astakhov, D. I., Goedheer, W. J., Lee, C. J., Ivanov, V. V., Krivtsun, V. M., Zotovich, A. I., … Bijkerk, F. . (2015). Plasma probe characteristics in low density hydrogen pulsed plasmas. Plasma Sources Science and Technology, 24(5), 055018. https://doi.org/10.1088/0963-0252/24/5/055018

Dolgov, A. ., Lopaev, D. ., Lee, C. J., Zoethout, E. ., Medvedev, V. ., Yakushev, O. ., & Bijkerk, F. . (2015). Characterization of carbon contamination under ion and hot atom bombardment in a tin-plasma extreme ultraviolet light source. Applied Surface Science, 353, 708-713. https://doi.org/10.1016/j.apsusc.2015.06.079 (Original work published)

Gao, A. ., Zoethout, E. ., Sturm, J. M., Lee, C. J., & Bijkerk, F. . (2014). Defect formation in single layer graphene under extreme ultraviolet irradiation. Applied Surface Science, 317, 745-751. https://doi.org/10.1016/j.apsusc.2014.08.177 (Original work published 2024)

Gao, A. ., Lee, C. J., & Bijkerk, F. . (2014). Graphene defect formation by extreme ultraviolet generated photoelectrons. Journal of Applied Physics, 116, 054312. https://doi.org/10.1063/1.4892485 (Original work published)

Fan, Y. ., Oldenbeuving, R. M., Khan, M. R. H., Roeloffzen, C. G. H., Klein, E. J., Lee, C. J., … Boller, K. J. (2014). Q-factor measurements through injection locking of a semiconductor-glass hybrid laser with unknown intracavity losses. Optics Letters, 39(7), 1748-1751. https://doi.org/10.1364/ol.39.001748 (Original work published)

Dolgov, A. ., Lopaev, D. ., Rachimova, T. ., Kovalev, A. ., Vasil’Eva, A. ., Lee, C. J., … Bijkerk, F. . (2014). Comparison of H2 and He carbon cleaning mechanisms in extreme ultraviolet induced and surface wave discharge plasmas. Journal of Physics D: Applied Physics, 47(6), 065205. https://doi.org/10.1088/0022-3727/47/6/065205

Epping, J. P., Kues, M. ., van der Slot, P. J. M., Lee, C. J., Fallnich, C. ., & Boller, K. J. (2013). Integrated CARS source based on seeded four-wave mixing in silicon nitride. Optics Express, 21(26), 7. https://doi.org/DOI:10.1364/OE.21.032123 (Original work published)

Oldenbeuving, R. M., Song, H. ., Schitter, G. ., Verhaegen, M. ., Klein, E. J., Lee, C. J., … Boller, K. J. (2013). High precision wavelength estimation method for integrated optics. Optics Express, 21, 17042–17052. https://doi.org/10.1364/OE.21.017042 (Original work published 2024)