Vanbrug, H., van der Wiel, M. J., Vanderpol, R., Verhoeven, J., Vanderlaan, G., & Goedkoop, J. B. (1988). Reflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 6, 2182-2187. https://doi.org/10.1116/1.575009 (Original work published 1988)
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