DIFFER
DIFFER Publication
Reflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
1988
|
| Journal |
Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films
|
| Volume |
6
|
| Number |
4
|
| Number of Pages |
2182-2187
|
| Date Published |
07/1988
|
| ISBN Number |
0734-2101
|
| DOI | |
| PId |
e46f371e904c068a43669df3550039c4
|
Journal Article
|
|
| Download citation |
Citation
Vanbrug, H., van der Wiel, M. J., Vanderpol, R., Verhoeven, J., Vanderlaan, G., & Goedkoop, J. B. (1988). Reflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 6, 2182-2187. https://doi.org/10.1116/1.575009 (Original work published 1988)