H. Vanbrug

Vanbrug, H., van Dorssen, G. E., & van der Wiel, M. J. (1989). Si L-Edge Structures in the Soft-X-Ray Reflectivity of Laser-Annealed Si Surfaces (with Ni Overlayers). Surface Science, 210, 69-84. https://doi.org/10.1016/0039-6028(89)90103-9 (Original work published 1989)

Vanbrug, H., van der Wiel, M. J., Vanderpol, R., Verhoeven, J., Vanderlaan, G., & Goedkoop, J. B. (1988). Reflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 6, 2182-2187. https://doi.org/10.1116/1.575009 (Original work published 1988)

Vanbrug, H., Bijkerk, F., van der Wiel, M. J., & Vanwingerden, B. (1987). Low-Z Element Analysis by Soft-X-Ray Line Emission of a Laser-Produced Plasma. Journal of Analytical Atomic Spectrometry, 2, 503-507. https://doi.org/10.1039/ja9870200503 (Original work published 1987)