DIFFER
DIFFER Publication
Si L-Edge Structures in the Soft-X-Ray Reflectivity of Laser-Annealed Si Surfaces (with Ni Overlayers)
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
1989
|
| Journal |
Surface Science
|
| Volume |
210
|
| Number |
1-2
|
| Number of Pages |
69-84
|
| Date Published |
03/1989
|
| ISBN Number |
0039-6028
|
| DOI | |
| PId |
8500e41263826181b186755654d85b4b
|
Journal Article
|
|
| Download citation |
Citation
Vanbrug, H., van Dorssen, G. E., & van der Wiel, M. J. (1989). Si L-Edge Structures in the Soft-X-Ray Reflectivity of Laser-Annealed Si Surfaces (with Ni Overlayers). Surface Science, 210, 69-84. https://doi.org/10.1016/0039-6028(89)90103-9 (Original work published 1989)