G. E. van Dorssen

Voorma, H. J., van Dorssen, G. E., Louis, E., Koster, N. B., Smith, A. D., Roper, M. D., & Bijkerk, F. (1996). EXAFS measurements on the structure of Mo/Si multilayers produced using ion bombardment and increased deposition temperature. Applied Surface Science, 93, 221-230. https://doi.org/10.1016/0169-4332(95)00347-9 (Original work published 1996)

Bijkerk, F., Louis, E., van Dorssen, G. E., Shevelko, A. P., & Vasilyev, A. A. (1994). Absolute Brightness of Laser Plasmas in the Soft-X-Ray Emission Band. Applied Optics, 33, 82-88. (Original work published 1994)

Louis, E., Voorma, H. J., Koster, N. B., Shmaenok, L., Bijkerk, F., Schlatmann, R., … Padmore, H. A. (1994). Enhancement of Reflectivity of Multilayer Mirrors for Soft-X-Ray Projection Lithography by Temperature Optimization and Ion-Bombardment. Microelectronic Engineering, 23, 215-218. https://doi.org/10.1016/0167-9317(94)90140-6 (Original work published 1994)

van Dorssen, G. E., Louis, E., & Bijkerk, F. (1992). Optimization of X-Ray-Emission from a Laser-Produced Plasma in a Narrow Wavelength Band. Laser and Particle Beams, 10, 759-765. (Original work published 1992)

Puik, E. J., van Dorssen, G. E., van der Wiel, M. J., Verhoeven, J., Vanderlaan, G., & Padmore, H. A. (1991). Characterization of the Resolving Power of a Double Multilayer Monochromator in the Energy-Range of 600-900 Ev. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 9, 3142-3148. https://doi.org/10.1116/1.577185 (Original work published 1991)

Vanbrug, H., van Dorssen, G. E., & van der Wiel, M. J. (1989). Si L-Edge Structures in the Soft-X-Ray Reflectivity of Laser-Annealed Si Surfaces (with Ni Overlayers). Surface Science, 210, 69-84. https://doi.org/10.1016/0039-6028(89)90103-9 (Original work published 1989)