G. Vanderlaan

Puik, E. J., van Dorssen, G. E., van der Wiel, M. J., Verhoeven, J., Vanderlaan, G., & Padmore, H. A. (1991). Characterization of the Resolving Power of a Double Multilayer Monochromator in the Energy-Range of 600-900 Ev. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 9, 3142-3148. https://doi.org/10.1116/1.577185 (Original work published 1991)

Vanbrug, H., van der Wiel, M. J., Vanderpol, R., Verhoeven, J., Vanderlaan, G., & Goedkoop, J. B. (1988). Reflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 6, 2182-2187. https://doi.org/10.1116/1.575009 (Original work published 1988)