W. van Schaik

Chen, J. Q., Louis, E. ., Wormeester, H. ., Harmsen, R. ., van de Kruijs, R. ., Lee, C. J., … Bijkerk, F. . (2011). Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry. Measurement Science & Technology, 22(10), 105705. https://doi.org/10.1088/0957-0233/22/10/105705 (Original work published 2025)

Grecea, M. L., Gleeson, M. A., van Schaik, W. ., Kleyn, A. W., & Bijkerk, F. . (2011). Erratum to ’Co-adsorption of NH(3) and SO(2) on quartz(0 0 0 1): Formation of a stabilized complex (vol 511, pg 270, 2011)’. Chemical Physics Letters, 516(1-3), 111-111. https://doi.org/10.1016/j.cplett.2011.08.023 (Original work published 2025)

Chen, J. Q., Louis, E. ., Harmsen, R. ., Tsarfati, T. ., Wormeester, H. ., van Kampen, M. ., … Bijkerk, F. . (2011). In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers. Applied Surface Science, 258(1), 7-12. https://doi.org/10.1016/j.apsusc.2011.07.121 (Original work published 2025)

Grecea, M. L., Gleeson, M. A., van Schaik, W. ., Kleyn, A. W., & Bijkerk, F. . (2011). Co-adsorption of NH(3) and SO(2) on quartz(0001): Formation of a stabilized complex. Chemical Physics Letters, 511(4-6), 270-276. https://doi.org/10.1016/j.cplett.2011.06.076 (Original work published 2025)

Chen, J. Q., Louis, E. ., Verhoeven, J. ., Harmsen, R. ., Lee, C. J., Lubomska, M. ., … Bijkerk, F. . (2010). Secondary electron yield measurements of carbon covered multilayer optics. Applied Surface Science, 257, 354-361. Retrieved from <Go to ISI>://000281674200003 (Original work published 2025)

Chen, J. Q., Louis, E. ., Lee, C. J., Wormeester, H. ., Kunze, R. ., Schmidt, H. ., … Bijkerk, F. . (2009). Detection and characterization of carbon contamination on EUV multilayer mirrors. Optics Express, 17, 16969-16979. Retrieved from <Go to ISI>://000269736100067 (Original work published 2025)