DIFFER

J. W. Weber

First name
J.
Middle name
W.
Last name
Weber
Leick, N. ., Weber, J. W., Mackus, A. J. M., Weber, M. J., van de Sanden, M. C. M., & Kessels, W. M. M. (2016). Erratum: In situ spectroscopic ellipsometry during atomic layer deposition of Pt, Ru and Pd (2016 J. Phys. D: Appl. Phys . 49 115504). Journal of Physics D: Applied Physics, 49(26), 269601. https://doi.org/10.1088/0022-3727/49/26/269601
Leick, N. ., Weber, J. W., Mackus, A. J. M., Weber, M. J., van de Sanden, M. C. M., & Kessels, W. M. M. (2016). In situ spectroscopic ellipsometry during atomic layer deposition of Pt, Ru and Pd. Journal of Physics D: Applied Physics, 49(11), 115504. https://doi.org/10.1088/0022-3727/49/11/115504
Weber, J. W. (2015). Graphene : an optical diagnostic study (Eindhoven University of Technology). Eindhoven University of Technology, Eindhoven, Netherlands. Retrieved from https://research.tue.nl/en/publications/graphene-an-optical-diagnostic-study (Original work published)
Sahin, D. ., Gaggero, A. ., Weber, J. W., Agafonov, I. ., Verheijen, M. A., Mattioli, F. ., … Fiore, A. . (2015). Waveguide Nanowire Superconducting Single-Photon Detectors Fabricated on GaAs and the Study of Their Optical Properties. Selected Topics in Quantum Electronics, IEEE Journal of, 21, 3800210. https://doi.org/10.1109/JSTQE.2014.2359539 (Original work published 2025)
Weber, J. W., Bol, A. A., & van de Sanden, M. C. M. (2014). An improved thin film approximation to accurately determine the optical conductivity of graphene from infrared transmittance. Applied Physics Letters, 105, 013105. https://doi.org/http://dx.doi.org/10.1063/1.4889852
Beyene, H. T., Weber, J. W., Verheijen, M. A., van de Sanden, M. C. M., & Creatore, M. . (2012). Real time in situ spectroscopic ellipsometry of the growth and plasmonic properties of au nanoparticles on SiO2. Nano Research, 5(8), 513-520. https://doi.org/10.1007/s12274-012-0236-z (Original work published 2025)
Weber, J. W., Hinrichs, K. ., Gensch, M. ., van de Sanden, M. C. M., & Oates, T. W. H. (2011). Microfocus infrared ellipsometry characterization of air-exposed graphene flakes. Applied Physics Letters, 99(6), 3. https://doi.org/10.1063/1.3624826 (Original work published 2025)