Abdali, S. ., Gerward, L. ., Yakshin, A. E., Louis, E. ., & Bijkerk, F. . (2002). Determination of crystallization as a function of Mo layer thickness in Mo/Si multilayers. Materials Research Bulletin, 37, 279-289. Retrieved from <Go to ISI>://000175048300009 (Original work published 2025)
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