DIFFER
DIFFER Publication
Determination of crystallization as a function of Mo layer thickness in Mo/Si multilayers
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
2002
|
| Journal |
Materials Research Bulletin
|
| Volume |
37
|
| Number |
2
|
| Number of Pages |
279-289
|
| Date Published |
02/2002
|
| ISBN Number |
0025-5408
|
| Accession Number |
ISI:000175048300009
|
| URL | |
| PId |
879eccccf07c618e9e2225e760d7aea0
|
Journal Article
|
|
| Download citation |
Citation
Abdali, S., Gerward, L., Yakshin, A. E., Louis, E., & Bijkerk, F. (2002). Determination of crystallization as a function of Mo layer thickness in Mo/Si multilayers. Materials Research Bulletin, 37, 279-289. Retrieved from <Go to ISI>://000175048300009 (Original work published 2002)