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DIFFER Publication
Label | Value |
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Author | |
Abstract |
A high-resolution spectrometer for the wavelength range 40-200 nm was adapted to a high-speed photo-electric detection system. A wavelength range of 3 nm can be measured up to every 0.2 ms with a resolution of 0.0012 nm and a wavelength accuracy of 0.0001 nm. The system is used for plasma spectroscopy at the Rijnhuizen Tokamak Project. Temperature measurements were performed with a resolution of 0.1 eV and changes in rotation velocity of 100 m s(-1) were observed. |
Year of Publication |
1999
|
Journal |
Measurement Science & Technology
|
Volume |
10
|
Number |
5
|
Number of Pages |
367-373
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Date Published |
May
|
ISBN Number |
0957-0233
|
DOI | |
PId |
ae9007d2094609743a17c366dc04a0a4
|
Journal Article
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