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Measuring one-dimensional and two-dimensional impurity density profiles on TEXTOR using combined charge exchange-beam emission spectroscopy and ultrasoft x-ray tomography
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
2004
|
| Journal |
Review of Scientific Instruments
|
| Volume |
75
|
| Number |
10
|
| Number of Pages |
4155-4157
|
| Date Published |
10/2004
|
| ISBN Number |
0034-6748
|
| Accession Number |
ISI:000224755900232
|
| URL | |
| PId |
8d708d98819c76cd290fdd6ea1dd1110
|
Journal Article
|
|
| Download citation |
Citation
De Bock, M., Jakubowska, K., von Hellermann, M., Jaspers, R., Donne, A. J. H., & Shmaenok, L. (2004). Measuring one-dimensional and two-dimensional impurity density profiles on TEXTOR using combined charge exchange-beam emission spectroscopy and ultrasoft x-ray tomography. Review of Scientific Instruments, 75, 4155-4157. Retrieved from <Go to ISI>://000224755900232 (Original work published 2004)