L. Shmaenok

Donne, A. J. H., de Bock, M. F. M., Classen, I. ., von Hellermann, M. G., Jakubowska, K. ., Jaspers, R. ., … Shmaenok, L. . (2005). Overview of core diagnostics for TEXTOR. Fusion Science and Technology, 47, 220-245. Retrieved from <Go to ISI>://000226876100017 (Original work published 2024)

von Hellermann, M. ., De Bock, M. ., Jaspers, R. ., Jakubowska, K. ., Barnsley, R. ., Giroud, C. ., … Shmaenok, L. . (2004). Pilot experiments for the International Thermonuclear Experimental Reactor active beam spectroscopy diagnostic. Review of Scientific Instruments, 75, 3458-3461. Retrieved from <Go to ISI>://000224755900024 (Original work published 2024)

Jakubowska, K. ., De Bock, M. ., Jaspers, R. ., von Hellermann, M. ., & Shmaenok, L. . (2004). Motional Stark effect diagnostic on TEXTOR. Review of Scientific Instruments, 75, 3475-3477. Retrieved from <Go to ISI>://000224755900029 (Original work published 2024)

De Bock, M. ., Jakubowska, K. ., von Hellermann, M. ., Jaspers, R. ., Donne, A. J. H., & Shmaenok, L. . (2004). Measuring one-dimensional and two-dimensional impurity density profiles on TEXTOR using combined charge exchange-beam emission spectroscopy and ultrasoft x-ray tomography. Review of Scientific Instruments, 75, 4155-4157. Retrieved from <Go to ISI>://000224755900232 (Original work published 2024)

Donne, A. J. H., Jaspers, R. ., Barth, C. J., Bindslev, H. ., Elzendoorn, B. S. Q., van Gorkom, J. C., … Shmaenok, L. . (2001). New diagnostics for physics studies on TEXTOR-94 (invited). Review of Scientific Instruments, 72, 1046-1053. (Original work published 2024)

Bijkerk, F. ., Shmaenok, L. ., Vanhonk, A. ., Bastiaensen, R. ., . Y. Platonov, Y. ., Shevelko, A. P., … Nikolaus, B. . (1994). Laser-Plasma Sources for Soft-X-Ray Projection Lithography. Journal De Physique Iii, 4, 1669-1677. https://doi.org/10.1051/jp3:1994232 (Original work published 2024)

Louis, E. ., Voorma, H. J., Koster, N. B., Shmaenok, L. ., Bijkerk, F. ., Schlatmann, R. ., … Padmore, H. A. (1994). Enhancement of Reflectivity of Multilayer Mirrors for Soft-X-Ray Projection Lithography by Temperature Optimization and Ion-Bombardment. Microelectronic Engineering, 23, 215-218. https://doi.org/10.1016/0167-9317(94)90140-6 (Original work published 2024)

Louis, E. ., Bijkerk, F. ., Shmaenok, L. ., Voorma, H. J., van der Wiel, M. J., Schlatmann, R. ., … Nikolaus, B. . (1993). Soft-X-Ray Projection Lithography Using a High-Repetition-Rate Laser-Induced X-Ray Source for Sub-100 Nanometer Lithography Processes. Microelectronic Engineering, 21, 67-70. https://doi.org/10.1016/0167-9317(93)90028-4 (Original work published 2024)