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Stimulated terahertz emission due to electronic Raman scattering in silicon

Author
Abstract

Stimulated Raman emission in the terahertz frequency range (4.8-5.1 THz and 5.9-6.5 THz) has been realized by optical excitation of arsenic donor centers in silicon at low temperatures. The Stokes shift of the observed laser emission is 5.42 THz which is equal to the Raman-active donor electronic transition between the ground 1s(A(1)) and the excited 1s(E) arsenic states. Optical thresholds of the Raman laser are similar to those observed for other silicon donor lasers. In addition, intracenter donor lasing has been observed when pumping on the dipole-forbidden 1s(A(1))-> 2s transition.

Year of Publication
2009
Journal
Applied Physics Letters
Volume
94
Number
17
Number of Pages
3
Date Published
Apr
Type of Article
Article
ISBN Number
0003-6951
Accession Number
ISI:000265738700012
URL
<Go to ISI>://000265738700012
PId
2d6c2b3eaa01db54c45d21aa15137ed2
Alternate Journal
Appl. Phys. Lett.
Journal Article
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