Reflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings

TitleReflection Extended X-Ray Absorption Fine-Structure Measurements on Ni/C and Nixsiy/C Multilayered Reflection Coatings
Publication TypeJournal Article
Year of Publication1988
AuthorsH. Vanbrug, M.J van der Wiel, R. Vanderpol, J. Verhoeven, G. Vanderlaan, J.B Goedkoop
JournalJournal of Vacuum Science & Technology a-Vacuum Surfaces and Films
Volume6
Number4
Pagination2182-2187
Date PublishedJul-Aug
ISBN Number0734-2101
DOI10.1116/1.575009
PID

e46f371e904c068a43669df3550039c4

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