|Title||Measurements of the current density profile with tangential Thomson scattering in RTP|
|Publication Type||Journal Article|
|Year of Publication||2001|
|Authors||F.A Karelse, M. de Bruijne, C.J Barth, M.NA Beurskens, G.MD Hogeweij, N.JL Cardozo|
|Journal||Plasma Physics and Controlled Fusion|
The electron drift velocity (v(d,e)) profile is measured with tangential Thomson scattering (TTS). From this, the current density (j) profile is determined, extending over 60% of the plasma diameter (2a) with a spatial resolution of 12% of a. The statistical error of similar to 10% is in agreement with the expected accuracy based on simulation studies. Two analysis methods are compared and found to agree. Results of TTS in electron cyclotron heated discharges with peaked and hollow j profiles are in good agreement with neo-classical resistivity.
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