R. Stuik

Kuznetsov, A. S., Stuik, R., Bijkerk, F., & Shevelko, A. P. (2012). Spectral and spatial structure of extreme ultraviolet radiation in laser plasma-wall interactions. Plasma Physics and Controlled Fusion, 54(8), 085019. https://doi.org/10.1088/0741-3335/54/8/085019 (Original work published 2012)

Bijkerk, F., Alonso van der Westen, S., Bruineman, C., Huiting, R., de Bruijn, R., Stuik, R., & Bakshi, V. (2006). Flying Circus EUV Source Metrology and Source Development Assessment. In EUV Sources for Lithography (pp. 721-734). Bellingham: SPIE.

Stuik, R. (2002). Characterization of XUV sources (Eindhoven University of Technology). Eindhoven University of Technology, Eindhoven, Netherlands. https://doi.org/10.6100/IR558141 (Original work published 2002)

Stuik, R., Scholze, F., Tummler, J., & Bijkerk, F. (2002). Absolute calibration of a multilayer-based XUV diagnostic. Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, 492, 305-316. Retrieved from <Go to ISI>://000178825300028 (Original work published 2002)

Stuik, R., & Bijkerk, F. (2002). Linearity of P-N junction photodiodes under pulsed irradiation. Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, 489, 370-378. Retrieved from <Go to ISI>://000177920500035 (Original work published 2002)

Stuik, R., Louis, E., Yakshin, A. E., Gorts, P. C., Maas, E. L. G., Bijkerk, F., … Haidl, M. (1999). Peak and Integrated reflectivity, wavelength and gamma optimization of Mo/Si, and Mo/Be multilayer, multielement optics for extreme ultraviolet lithography. Journal of Vacuum Science & Technology B, 17, 2998-3002. https://doi.org/10.1116/1.590942 (Original work published 1999)

Stuik, R., Shmaenok, L. A., Fledderus, H., Andreev, S. S., Shamov, E. A., Zuev, S. Y., … Bijkerk, F. (1999). Development of low-energy x-ray fluorescence micro-distribution analysis using a laser plasma x-ray source and multilayer optics? Journal of Analytical Atomic Spectrometry, 14, 387-390. https://doi.org/10.1039/a807614f (Original work published 1999)