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Development of low-energy x-ray fluorescence micro-distribution analysis using a laser plasma x-ray source and multilayer optics?

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Abstract

A new technique is presented for low-energy X-ray fluorescence micro-distribution analysis of low-Z elements at micrometer spatial resolutions. The technique is based on the use of a laser plasma X-ray source and spherically curved multilayer optics. A large collimator is used to focus the light from the laser plasma on the sample and a Schwarzschild mirror set is used to image the fluorescent radiation on a 2D CCD unit. A first system, now under development, is designed for detection of the carbon K alpha-line. The system consists of a Cr/Sc collimator of 260 mm diameter, focusing 0.7 sr of the light from the plasma on the sample, and an Fe/C Schwarzschild mirror set with 20 x magnification for detection of the carbon in the sample. A resolution in the micrometer range is expected to be achievable, with a detection limit of a few per cent. Upgrading of this system is expected to result in sub-micrometer resolution and a detection limit in the ppm range.

Year of Publication
1999
Journal
Journal of Analytical Atomic Spectrometry
Volume
14
Number
3
Number of Pages
387-390
Date Published
03/1999
ISBN Number
0267-9477
DOI
PId
ffd8957f3c47ad8f46de5ece20dcc677
Journal Article
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Citation
Stuik, R., Shmaenok, L. A., Fledderus, H., Andreev, S. S., Shamov, E. A., Zuev, S. Y., … Bijkerk, F. (1999). Development of low-energy x-ray fluorescence micro-distribution analysis using a laser plasma x-ray source and multilayer optics? Journal of Analytical Atomic Spectrometry, 14, 387-390. https://doi.org/10.1039/a807614f (Original work published 1999)