A. E. Yakshin

Bosgra, J., Zoethout, E., van der Eerden, A. M. J., Verhoeven, J., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2012). Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors. Applied Optics, 51, 8541-8548. https://doi.org/10.1364/AO.51.008541 (Original work published)

Medvedev, V. V., Yakshin, A. E., van de Kruijs, R. W. E., Krivtsun, V. M., Yakunin, A. M., Koshelev, K. N., & Bijkerk, F. (2012). Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectors. Optics Letters, 37(7), 1169-1171. https://doi.org/10.1364/OL.37.001169 (Original work published 2012)

Makhotkin, I. A., Louis, E., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Seregin, A. Y., … Bijkerk, F. (2011). Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves. Physica Status Solidi A-Applications and Materials Science, 208, 2597-2600. https://doi.org/10.1002/pssa.201184256 (Original work published 2011)

Louis, E., Yakshin, A. E., Tsarfati, T., & Bijkerk, F. (2011). Nanometer interface and materials control for multilayer EUV-optical applications. Progress in Surface Science, 86(11-12), 255-294. https://doi.org/10.1016/j.progsurf.2011.08.001 (Original work published 2011)

de Rooij-Lohmann, V., Yakshin, A. E., Zoethout, E., Verhoeven, J., & Bijkerk, F. (2011). Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection. Applied Surface Science, 257(14), 6251-6255. https://doi.org/10.1016/j.apsusc.2011.02.054 (Original work published 2011)

Medvedev, V. V., Yakshin, A. E., van de Kruijs, R. W. E., Krivtsun, V. M., Yakunin, A. M., Koshelev, K. N., & Bijkerk, F. (2011). Infrared suppression by hybrid EUV multilayer-IR etalon structures. Optics Letters, 36(17), 3344-3346. https://doi.org/10.1364/OL.36.003344 (Original work published 2011)

Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2011). In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films. Applied Surface Science, 257(7), 2707-2711. https://doi.org/0.1016/j.apsusc.2010.10.049 (Original work published 2011)

de Rooij-Lohmann, V., Kozhevnikov, I. V., Peverini, L., Ziegler, E., Cuerno, R., Bijkerk, F., & Yakshin, A. E. (2010). Roughness evolution of Si surfaces upon Ar ion erosion. Applied Surface Science, 256, 5011-5014. Retrieved from <Go to ISI>://000276929600026 (Original work published 2010)

de Rooij-Lohmann, V., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Kleyn, A. W., Keim, E. G., … Bijkerk, F. (2010). Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics, 108, 5. Retrieved from <Go to ISI>://000280000400090 (Original work published 2010)

Dobrovolskiy, S., Yakshin, A. E., Tichelaar, F. D., Verhoeven, J., Louis, E., & Bijkerk, F. (2010). Formation of Si/SiC multilayers by low-energy ion implantation and thermal annealing. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms, 268, 560-567. Retrieved from <Go to ISI>://000276053700004 (Original work published 2010)