F. Bijkerk

Tsarfati, T., Zoethout, E., van de Kruijs, R. W. E., & Bijkerk, F. (2009). Atomic O and H exposure of C-covered and oxidized d-metal surfaces. Surface Science, 603, 2594-2599. Retrieved from <Go to ISI>://000269415500036 (Original work published 2009)

Loch, R. A., Levy, A., Ceccotti, T., Quere, F., Thaury, C., George, H., … Martin, P. (2009). Enhanced ion acceleration with extremely thin foils. European Physical Journal-Special Topics, 175, 133-138. Retrieved from <Go to ISI>://000269143800023 (Original work published 2009)

Nedelcu, I., van de Kruijs, R. W. E., Yakshin, A. E., von Blanckenhagen, G., & Bijkerk, F. (2008). Reflectivity and surface roughness of multilayer-coated substrate recovery layers for EUV lithographic optics. Optical Engineering, 47, 5. Retrieved from <Go to ISI>://000257884800009 (Original work published 2008)

van Herpen, M., van de Kruijs, R. W., Klunder, D. J. W., Louis, E., Yakshin, A. E., Alonso van der Westen, S., … Banine, V. (2008). Spectral-purity-enhancing layer for multilayer mirrors. Optics Letters, 33, 560-562. Retrieved from <Go to ISI>://000254907500010 (Original work published 2008)

Nedelcu, I., van de Kruijs, R. W., Yakshin, A. E., & Bijkerk, F. (2008). Thermally enhanced interdiffusion in Mo/Si multilayers. Journal of Applied Physics, 103, 6. Retrieved from <Go to ISI>://000255456200080 (Original work published 2008)

Krist, T., Teichert, A., Zoethout, E., Bijkerk, F., Meltchakov, E., Vidal, V., & Muellender, S. (2008). Stress Reduction in Multilayers Used for X-Ray and Neutron Optics. In Modern Developments in X-Ray and Neutron Optics, Springer Series in Optical Sciences (Vol. 137). Springer. https://doi.org/10.1007/978-3-540-74561-7_23

Wieggers, R. C., Goedheer, W. J., Akdim, M., Bijkerk, F., & Zegeling, P. A. (2008). A particle-in-cell plus Monte Carlo study of plasma-induced damage of normal incidence collector optics used in extreme ultraviolet lithography. Journal of Applied Physics, 103, 7. Retrieved from <Go to ISI>://000252890700023 (Original work published 2008)

Nedelcu, I., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. (2007). Temperature-dependent nanocrystal formation in Mo/Si multilayers. Physical Review B, 76. Retrieved from <Go to ISI>://000251986600085 (Original work published 2007)

Kessels, M. J. H., Verhoeven, J., Tichelaar, F. D., & Bijkerk, F. (2006). Si adhesion interlayer effects in hydrogen passivated Si/W soft X-ray multilayer mirrors. Surface Science, 600, 1405-1408. Retrieved from <Go to ISI>://000236455100029 (Original work published 2006)

Ivanov, V. V., Antsiferov, P. S., Koshelev, K. N., Akdim, M., & Bijkerk, F. (2006). Numerical simulation of the creation of a hollow neutral-hydrogen channel by an electron beam. Physical Review Letters, 97. Retrieved from <Go to ISI>://000242101600029 (Original work published 2006)