DIFFER

F. Bijkerk

First name
F.
Last name
Bijkerk
van de Kruijs, R. W. E., Zoethout, E., Yakshin, A. E., Nedelcu, I., Louis, E., Enkisch, H., … Bijkerk, F. (2006). Nano-size crystallites in Mo/Si multilayer optics. Thin Solid Films, 515, 430-433. Retrieved from <Go to ISI>://000241220600011 (Original work published 2006)
Nedelcu, I., van de Kruijs, R. W., Yakshin, A. E., Tichelaar, F., Zoethout, E., Louis, E., … Bijkerk, F. (2006). Interface roughness in Mo/Si multilayers. Thin Solid Films, 515, 434-438. Retrieved from <Go to ISI>://000241220600012 (Original work published 2006)
Alink, L., van de Kruijs, R. W., Louis, E., Bijkerk, F., & Verhoeven, J. (2006). Improved temperature stability of Mo/Si multilayers by carbide based diffusion barriers through implantation of low energy CHx+ ions. Thin Solid Films, 510, 26-31. Retrieved from <Go to ISI>://000238011200005 (Original work published 2006)
Bijkerk, F., Alonso van der Westen, S., Bruineman, C., Huiting, R., de Bruijn, R., Stuik, R., & Bakshi, V. (2006). Flying Circus EUV Source Metrology and Source Development Assessment. In EUV Sources for Lithography (pp. 721-734). Bellingham: SPIE.
Kessels, M. J. H., Bijkerk, F., Tichelaar, F. D., & Verhoeven, J. (2005). Determination of in-depth density profiles of multilayer structures. Journal of Applied Physics, 97. Retrieved from <Go to ISI>://000229155600023 (Original work published 2005)
Kessels, M. J. H., Verhoeven, J., Tichelaar, F. D., & Bijkerk, F. (2005). Ion-induced interface layer formation in W/Si and WRe/Si multilayers. Surface Science, 582, 227-234. Retrieved from <Go to ISI>://000229341500025 (Original work published 2005)
de Bruijn, R., Koshelev, K. N., Zakharov, S. V., Novikov, V. G., & Bijkerk, F. (2005). Enhancement of laser plasma extreme ultraviolet emission by shockwave-laser interaction. Physics of Plasmas, 12. Retrieved from <Go to ISI>://000228865900037 (Original work published 2005)
Kessels, M. J. H., Verhoeven, J., Yakshin, A. E., Tichelaar, F. D., & Bijkerk, F. (2004). Ion beam induced intermixing of interface structures in W/Si multilayers. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms, 222, 484-490. Retrieved from <Go to ISI>://000223121800016 (Original work published 2004)
Ivanov, V. V., Koshelev, K. N., Toma, E. S., & Bijkerk, F. (2003). Influence of an axial magnetic field on the density profile of capillary plasma channels. Journal of Physics D-Applied Physics, 36, 832-836. Retrieved from <Go to ISI>://000182586400012 (Original work published 2003)
de Bruijn, R., Koshelev, K., Kooijman, G., Toma, E. S., & Bijkerk, F. (2003). Absorption of EUV in laser plasmas generated on xenon gas jets. Journal of Quantitative Spectroscopy & Radiative Transfer, 81, 97-105. Retrieved from <Go to ISI>://000184077000010 (Original work published 2003)