DIFFER
DIFFER Publication
Ion-induced interface layer formation in W/Si and WRe/Si multilayers
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
2005
|
| Journal |
Surface Science
|
| Volume |
582
|
| Number |
1-3
|
| Number of Pages |
227-234
|
| Date Published |
05/2005
|
| ISBN Number |
0039-6028
|
| Accession Number |
ISI:000229341500025
|
| URL | |
| PId |
c0cb5eeaaeb60aeb24e9cde5ba26bc49
|
Journal Article
|
|
| Download citation |
Citation
Kessels, M. J. H., Verhoeven, J., Tichelaar, F. D., & Bijkerk, F. (2005). Ion-induced interface layer formation in W/Si and WRe/Si multilayers. Surface Science, 582, 227-234. Retrieved from <Go to ISI>://000229341500025 (Original work published 2005)