F. D. Tichelaar

Sharma, K. ., Ponomarev, M. V., Verheijen, M. A., Kunz, O. ., Tichelaar, F. D., van de Sanden, M. C. M., & Creatore, M. . (2012). Solid-phase crystallization of ultra high growth rate amorphous silicon films. Journal of Applied Physics, 111(10), 5. https://doi.org/10.1063/1.4717951 (Original work published 2025)

Sharma, K. ., Branca, A. ., Illiberi, A. ., Tichelaar, F. D., Creatore, M. ., & van de Sanden, M. C. M. (2011). On the Effect of the Amorphous Silicon Microstructure on the Grain Size of Solid Phase Crystallized Polycrystalline Silicon. Advanced Energy Materials, 1(3), 401-406. https://doi.org/10.1002/aenm.201000074 (Original work published 2025)

Beyene, H. T., Tichelaar, F. D., Verheijen, M. A., van de Sanden, M. C. M., & Creatore, M. . (2011). Plasma-Assisted Deposition of Au/SiO2 Multi-layers as Surface Plasmon Resonance-Based Red-Colored Coatings. Plasmonics, 6(2), 255-260. https://doi.org/10.1007/s11468-010-9197-9 (Original work published 2025)

Dobrovolskiy, S. ., Yakshin, A. E., Tichelaar, F. D., Verhoeven, J. ., Louis, E. ., & Bijkerk, F. . (2010). Formation of Si/SiC multilayers by low-energy ion implantation and thermal annealing. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms, 268, 560-567. Retrieved from <Go to ISI>://000276053700004 (Original work published 2025)

Kessels, M. J. H., Verhoeven, J. ., Tichelaar, F. D., & Bijkerk, F. . (2006). Si adhesion interlayer effects in hydrogen passivated Si/W soft X-ray multilayer mirrors. Surface Science, 600, 1405-1408. Retrieved from <Go to ISI>://000236455100029 (Original work published 2025)

Kessels, M. J. H., Bijkerk, F. ., Tichelaar, F. D., & Verhoeven, J. . (2005). Determination of in-depth density profiles of multilayer structures. Journal of Applied Physics, 97. Retrieved from <Go to ISI>://000229155600023 (Original work published 2025)

Kessels, M. J. H., Verhoeven, J. ., Tichelaar, F. D., & Bijkerk, F. . (2005). Ion-induced interface layer formation in W/Si and WRe/Si multilayers. Surface Science, 582, 227-234. Retrieved from <Go to ISI>://000229341500025 (Original work published 2025)

Kessels, M. J. H., Verhoeven, J. ., Yakshin, A. E., Tichelaar, F. D., & Bijkerk, F. . (2004). Ion beam induced intermixing of interface structures in W/Si multilayers. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms, 222, 484-490. Retrieved from <Go to ISI>://000223121800016 (Original work published 2025)