DIFFER
DIFFER Publication
Determination of in-depth density profiles of multilayer structures
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
2005
|
| Journal |
Journal of Applied Physics
|
| Volume |
97
|
| Number |
9
|
| Date Published |
05/2005
|
| ISBN Number |
0021-8979
|
| Accession Number |
ISI:000229155600023
|
| URL | |
| PId |
3907b669a07790a877bbb56cba8448b3
|
Journal Article
|
|
| Download citation |
Citation
Kessels, M. J. H., Bijkerk, F., Tichelaar, F. D., & Verhoeven, J. (2005). Determination of in-depth density profiles of multilayer structures. Journal of Applied Physics, 97. Retrieved from <Go to ISI>://000229155600023 (Original work published 2005)