M. J. H. Kessels

Kessels, M. J. H., Verhoeven, J., Tichelaar, F. D., & Bijkerk, F. (2006). Si adhesion interlayer effects in hydrogen passivated Si/W soft X-ray multilayer mirrors. Surface Science, 600, 1405-1408. Retrieved from <Go to ISI>://000236455100029 (Original work published 2025)

Kessels, M. J. H., Bijkerk, F., Tichelaar, F. D., & Verhoeven, J. (2005). Determination of in-depth density profiles of multilayer structures. Journal of Applied Physics, 97. Retrieved from <Go to ISI>://000229155600023 (Original work published 2025)

Kessels, M. J. H., Verhoeven, J., Tichelaar, F. D., & Bijkerk, F. (2005). Ion-induced interface layer formation in W/Si and WRe/Si multilayers. Surface Science, 582, 227-234. Retrieved from <Go to ISI>://000229341500025 (Original work published 2025)

Dobrovolskiy, S., Yakshin, A. E., Kessels, M. J. H., & Verhoeven, J. (2005). The application of energetic CHx+ ions to form a Si/SiC multilayer system for reflection of radiation between 20 and 80 nm. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms, 237, 533-542. Retrieved from <Go to ISI>://000231777800006 (Original work published 2025)

Kessels, M. J. H. (2005). Interfaces in soft x-ray multilayer mirrors (University of Twente). University of Twente, Enschede, Netherlands. Retrieved from http://doc.utwente.nl/50292/ (Original work published 2005)

Kessels, M. J. H., Verhoeven, J., Yakshin, A. E., Tichelaar, F. D., & Bijkerk, F. (2004). Ion beam induced intermixing of interface structures in W/Si multilayers. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms, 222, 484-490. Retrieved from <Go to ISI>://000223121800016 (Original work published 2025)