E. Zoethout

Dolgov, A., Lopaev, D., Lee, C. J., Zoethout, E., Medvedev, V., Yakushev, O., & Bijkerk, F. (2015). Characterization of carbon contamination under ion and hot atom bombardment in a tin-plasma extreme ultraviolet light source. Applied Surface Science, 353, 708-713. https://doi.org/10.1016/j.apsusc.2015.06.079 (Original work published)

Medvedev, V. V., Yang, J., Schmidt, A. J., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., & Bijkerk, F. (2015). Anisotropy of heat conduction in Mo/Si multilayers. Journal of Applied Physics, 118(8), 085101. https://doi.org/10.1063/1.4928958

van Rooij, G., van den Bekerom, D., den Harder, N., Minea, T., Berden, G., Bongers, W., … van de Sanden, M. C. M. (2015). Taming microwave plasma to beat thermodynamics in CO2 dissociation. Faraday Discussions, 178(Dec), 233-248. https://doi.org/10.1039/C5FD00045A

Huber, S. P., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Boller, K.-J., & Bijkerk, F. (2014). Subwavelength single layer absorption resonance antireflection coatings. Optics Express, 22, 490–497. https://doi.org/10.1364/OE.22.000490 (Original work published 2025)

Gao, A., Zoethout, E., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2014). Defect formation in single layer graphene under extreme ultraviolet irradiation. Applied Surface Science, 317, 745-751. https://doi.org/10.1016/j.apsusc.2014.08.177 (Original work published 2025)

Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Chuev, M. A., Pashaev, E., Zoethout, E., … Kovalchuk, M. V. (2014). Model independent X-ray standing wave analysis of periodic multilayer structures. Journal of Applied Physics, 115(13), 134303. https://doi.org/10.1063/1.4869540 (Original work published)

Huang, Q., Paardekooper, D. M., Zoethout, E., Medvedev, V. V., van de Kruijs, R., Bosgra, J., … Bijkerk, F. (2014). UV spectral filtering by surface structured multilayer mirrors. Optics Letters, 39(5), 1185-1188. https://doi.org/10.1364/ol.39.001185 (Original work published)

Zoethout, E. (2014). Influence of surface morphology on angular photo-electron spectroscopy measurements of nanometer thin overlayers. Surface and Interface Analysis, 46(10-11), 1047–1050. https://doi.org/10.1002/sia.5428

Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., von Blanckenhagen, G., Bosgra, J., … Bijkerk, F. (2013). Interlayer growth in Mo/B4C multilayered structures upon thermal annealing. Journal of Applied Physics, 113(14), 144310. https://doi.org/10.1063/1.4800910

Bosgra, J., Veldhuizen, L. W., Zoethout, E., Verhoeven, J., Loch, R. A., Yakshin, A. E., & Bijkerk, F. (2013). Interactions of C in layered Mo-Si structures. Thin Solid Films, 542, 210-213. https://doi.org/10.1016/j.tsf.2013.06.082