E. Zoethout

Makhotkin, I. A., Zoethout, E. ., van de Kruijs, R. ., Yakunin, S. N., Louis, E. ., Yakunin, A. M., … Bijkerk, F. . (2013). Short period La/B and LaN/B multilayer mirrors for similar to 6.8 nm wavelength. Optics Express, 21, 29894-29904. https://doi.org/10.1364/oe.21.029894 (Original work published 2025)

Gao, A. ., Rizo, P. J., Zoethout, E. ., Scaccabarozzi, L. ., Lee, C. J., Banine, V. ., & Bijkerk, F. . (2013). Extreme ultraviolet induced defects on few-layer graphene. Journal of Applied Physics, 114(4), 044313. https://doi.org/10.1063/1.4817082

Zoethout, E. ., Louis, E. ., & Bijkerk, F. . (2013). Real-space insight in the nanometer scale roughness development during growth and ion beam polishing of molybdenum silicon multilayer films. Applied Surface Science, 285, Part B, 293-299. https://doi.org/http://dx.doi.org/10.1016/j.apsusc.2013.08.053

Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E. ., & Bijkerk, F. . (2012). Thermally induced interface chemistry in Mo/B4C/Si/B4C multilayered films. Journal of Applied Physics, 112(5), 054317. https://doi.org/10.1063/1.4751029 (Original work published 2025)

Makhotkin, I. A., Zoethout, E. ., Louis, E. ., Yakunin, A. M., Mullender, S. ., & Bijkerk, F. . (2012). Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge. Optics Express, 20(11), 11778-11786. https://doi.org/10.1364/OE.20.011778 (Original work published 2025)

van den Boogaard, A. J. R., Zoethout, E. ., Makhotkin, I. A., Louis, E. ., & Bijkerk, F. . (2012). Influence of noble gas ion polishing species on extreme ultraviolet mirrors. Journal of Applied Physics, 112, 123502. https://doi.org/10.1063/1.4768915 (Original work published 2012)

Makhotkin, I. ., Zoethout, E. ., Louis, E. ., Yakunin, A. M., Muellender, S. ., & Bijkerk, F. . (2012). Wavelength selection for multilayer coatings for lithography generation beyond extreme ultraviolet. Journal of Micro Nanolithography, MEMS and MOEMS, 11, 040501. https://doi.org/10.1117/1.JMM.11.4.040501 (Original work published)

Bosgra, J. ., Zoethout, E. ., van der Eerden, A. M. J., Verhoeven, J. ., van de Kruijs, R. W. E., Yakshin, A. E., & Bijkerk, F. . (2012). Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors. Applied Optics, 51, 8541-8548. https://doi.org/10.1364/AO.51.008541 (Original work published)

Makhotkin, I. A., Louis, E. ., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E. ., . Y. Seregin, A. ., … Bijkerk, F. . (2011). Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves. Physica Status Solidi a-Applications and Materials Science, 208, 2597-2600. https://doi.org/10.1002/pssa.201184256 (Original work published 2025)

de Rooij-Lohmann, V. ., Yakshin, A. E., Zoethout, E. ., Verhoeven, J. ., & Bijkerk, F. . (2011). Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection. Applied Surface Science, 257(14), 6251-6255. https://doi.org/10.1016/j.apsusc.2011.02.054 (Original work published 2025)