E. Zoethout

de Rooij-Lohmann, V., Yakshin, A. E., Zoethout, E., Verhoeven, J., & Bijkerk, F. (2011). Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection. Applied Surface Science, 257(14), 6251-6255. https://doi.org/10.1016/j.apsusc.2011.02.054 (Original work published 2011)

van den Boogaard, A. J. R., Louis, E., Zoethout, E., Goldberg, K. A., & Bijkerk, F. (2011). Characterization of Mo/Si multilayer growth on stepped topographies. Journal of Vacuum Science & Technology B, 29(5), 6. https://doi.org/10.1116/1.3628640 (Original work published 2011)

Bystrov, K., Westerhout, J., Matveeva, M., Litnovsky, A., Marot, L., Zoethout, E., & De Temmerman, G. (2011). Erosion yields of carbon under various plasma conditions in Pilot-PSI. Journal of Nuclear Materials, 415(1), S149-S152. https://doi.org/10.1016/j.jnucmat.2010.11.067 (Original work published 2011)

van den Boogaard, A. J. R., Louis, E., Zoethout, E., Mullender, S., & Bijkerk, F. (2010). Surface morphology of Kr+-polished amorphous Si layers. Journal of Vacuum Science & Technology A, 28, 552-558. Retrieved from <Go to ISI>://000280479700009 (Original work published 2010)

de Rooij-Lohmann, V., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Kleyn, A. W., Keim, E. G., … Bijkerk, F. (2010). Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics, 108, 5. Retrieved from <Go to ISI>://000280000400090 (Original work published 2010)

Yakshin, A. E., Kozhevnikov, I. V., Zoethout, E., Louis, E., & Bijkerk, F. (2010). Properties of broadband depth-graded multilayer mirrors for EUV optical systems. Optics Express, 18, 6957-6971. Retrieved from <Go to ISI>://000276602000050 (Original work published 2010)

Wright, G. M., Al, R. S., Alves, E., Alves, L. C., Barradas, N. P., Kleyn, A. W., … Rapp, J. (2010). Carbon film growth and hydrogenic retention of tungsten exposed to carbon-seeded high density deuterium plasmas. Journal of Nuclear Materials, 396, 176-180. Retrieved from <Go to ISI>://000274557100005 (Original work published 2010)

de Rooij-Lohmann, V., Veldhuizen, L. W., Zoethout, E., Yakshin, A. E., van de Kruijs, R. W. E., Thijsse, B. J., … Bijkerk, F. (2010). Chemical interaction of B4C, B, and C with Mo/Si layered structures. Journal of Applied Physics, 108, 6. Retrieved from <Go to ISI>://000284270900129 (Original work published 2010)

Tsarfati, T., van de Kruijs, R. W. E., Zoethout, E., Louis, E., & Bijkerk, F. (2010). Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics. Thin Solid Films, 518, 7249-7252. Retrieved from <Go to ISI>://000282915100017 (Original work published 2010)

Bruijn, S., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., & Bijkerk, F. (2010). Thermally induced decomposition of B4C barrier layers in Mo/Si multilayer structures. Surface & Coatings Technology, 205, 2469-2473. Retrieved from <Go to ISI>://000286343100091 (Original work published 2010)