I. V. Kozhevnikov

van der Meer, R., Kozhevnikov, I. V., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. (2013). Extended theory of soft x-ray reflection for realistic lamellar multilayer gratings. Optics Express, 21, 13105-13117. https://doi.org/10.1364/oe.21.013105 (Original work published 2025)

Kozhevnikov, I. V., van der Meer, R., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. (2011). Analytic theory of soft x-ray diffraction by lamellar multilayer gratings. Optics Express, 19(10), 9172-9184. https://doi.org/10.1364/OE.19.009172 (Original work published 2025)

de Rooij-Lohmann, V., Kozhevnikov, I. V., Peverini, L., Ziegler, E., Cuerno, R., Bijkerk, F., & Yakshin, A. E. (2010). Roughness evolution of Si surfaces upon Ar ion erosion. Applied Surface Science, 256, 5011-5014. Retrieved from <Go to ISI>://000276929600026 (Original work published 2025)

Kozhevnikov, I. V., van der Meer, R., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. (2010). High-resolution, high-reflectivity operation of lamellar multilayer amplitude gratings: identification of the single-order regime. Optics Express, 18, 16234-16242. Retrieved from <Go to ISI>://000280693300105 (Original work published 2025)

Yakshin, A. E., Kozhevnikov, I. V., Zoethout, E., Louis, E., & Bijkerk, F. (2010). Properties of broadband depth-graded multilayer mirrors for EUV optical systems. Optics Express, 18, 6957-6971. Retrieved from <Go to ISI>://000276602000050 (Original work published 2025)