I. V. Kozhevnikov

van der Meer, R. ., Kozhevnikov, I. V., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. . (2013). Extended theory of soft x-ray reflection for realistic lamellar multilayer gratings. Optics Express, 21, 13105-13117. https://doi.org/10.1364/oe.21.013105 (Original work published 2025)

Kozhevnikov, I. V., van der Meer, R. ., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. . (2011). Analytic theory of soft x-ray diffraction by lamellar multilayer gratings. Optics Express, 19(10), 9172-9184. https://doi.org/10.1364/OE.19.009172 (Original work published 2025)

de Rooij-Lohmann, V. ., Kozhevnikov, I. V., Peverini, L. ., Ziegler, E. ., Cuerno, R. ., Bijkerk, F. ., & Yakshin, A. E. (2010). Roughness evolution of Si surfaces upon Ar ion erosion. Applied Surface Science, 256, 5011-5014. Retrieved from <Go to ISI>://000276929600026 (Original work published 2025)

Kozhevnikov, I. V., van der Meer, R. ., Bastiaens, H. M. J., Boller, K. J., & Bijkerk, F. . (2010). High-resolution, high-reflectivity operation of lamellar multilayer amplitude gratings: identification of the single-order regime. Optics Express, 18, 16234-16242. Retrieved from <Go to ISI>://000280693300105 (Original work published 2025)

Yakshin, A. E., Kozhevnikov, I. V., Zoethout, E. ., Louis, E. ., & Bijkerk, F. . (2010). Properties of broadband depth-graded multilayer mirrors for EUV optical systems. Optics Express, 18, 6957-6971. Retrieved from <Go to ISI>://000276602000050 (Original work published 2025)