H. Zeijlemaker

Puik, E. J., van der Wiel, M. J., Zeijlemaker, H. ., & Verhoeven, J. . (1992). Ion-Bombardment of Thin-Layers - the Effect on the Interface Roughness and Its X-Ray Reflectivity. Review of Scientific Instruments, 63, 1415-1419. https://doi.org/10.1063/1.1143031 (Original work published 2024)

Puik, F. J., van der Wiel, M. J., Zeijlemaker, H. ., & Verhoeven, J. . (1991). Ion Etching of Thin W-Layers - Enhanced Reflectivity of W-C Multilayer Coatings. Applied Surface Science, 47, 63-76. (Original work published 2024)

Puik, E. J., van der Wiel, M. J., Zeijlemaker, H. ., & Verhoeven, J. . (1991). Ion-Bombardment of X-Ray Multilayer Coatings - Comparison of Ion Etching and Ion Assisted Deposition. Applied Surface Science, 47, 251-260. https://doi.org/10.1016/0169-4332(91)90039-m (Original work published 2024)

Verhoeven, J. ., Zeijlemaker, H. ., Puik, E. J., & van der Wiel, M. J. (1990). On the Use of H+ and Ar+ Ions for High Spatial-Resolution Depth Profiling. Vacuum, 41, 1327-1329. https://doi.org/10.1016/0042-207x(90)93948-i (Original work published 1990)

Puik, E. J., van der Wiel, M. J., Zeijlemaker, H. ., & Verhoeven, J. . (1988). The Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors. Vacuum, 38, 707-709. https://doi.org/10.1016/0042-207x(88)90447-2 (Original work published 1988)