DIFFER
DIFFER Publication
The Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors
| Label | Value |
|---|---|
| Author | |
| Year of Publication |
1988
|
| Journal |
Vacuum
|
| Volume |
38
|
| Number |
8-10
|
| Number of Pages |
707-709
|
| Date Published |
1988
|
| ISBN Number |
0042-207X
|
| DOI | |
| PId |
41822815383a7e5cc384d55612e20f65
|
Journal Article
|
|
| Download citation |
Citation
Puik, E. J., van der Wiel, M. J., Zeijlemaker, H., & Verhoeven, J. (1988). The Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors. Vacuum, 38, 707-709. https://doi.org/10.1016/0042-207x(88)90447-2 (Original work published 1988)