E. J. Puik

Schlatmann, R., Lu, C., Verhoeven, J., Puik, E. J., & van der Wiel, M. J. (1994). Modification by Ar and Kr Ion-Bombardment of Mo/Si X-Ray Multilayers. Applied Surface Science, 78, 147-157. https://doi.org/10.1016/0169-4332(94)00108-1 (Original work published 1994)

Puik, E. J., van der Wiel, M. J., Zeijlemaker, H., & Verhoeven, J. (1992). Ion-Bombardment of Thin-Layers - the Effect on the Interface Roughness and Its X-Ray Reflectivity. Review of Scientific Instruments, 63, 1415-1419. https://doi.org/10.1063/1.1143031 (Original work published 1992)

Puik, E. J., van der Wiel, M. J., Zeijlemaker, H., & Verhoeven, J. (1991). Ion-Bombardment of X-Ray Multilayer Coatings - Comparison of Ion Etching and Ion Assisted Deposition. Applied Surface Science, 47, 251-260. https://doi.org/10.1016/0169-4332(91)90039-m (Original work published 1991)

Puik, E. J., van Dorssen, G. E., van der Wiel, M. J., Verhoeven, J., Vanderlaan, G., & Padmore, H. A. (1991). Characterization of the Resolving Power of a Double Multilayer Monochromator in the Energy-Range of 600-900 Ev. Journal of Vacuum Science & Technology A-Vacuum Surfaces and Films, 9, 3142-3148. https://doi.org/10.1116/1.577185 (Original work published 1991)

Verhoeven, J., Zeijlemaker, H., Puik, E. J., & van der Wiel, M. J. (1990). On the Use of H+ and Ar+ Ions for High Spatial-Resolution Depth Profiling. Vacuum, 41, 1327-1329. https://doi.org/10.1016/0042-207x(90)93948-i (Original work published 1990)

Puik, E. J., van der Wiel, M. J., Zeijlemaker, H., & Verhoeven, J. (1988). The Role of Layer Growth on Interface Roughness in Ni-C Multilayer X-Ray Mirrors. Vacuum, 38, 707-709. https://doi.org/10.1016/0042-207x(88)90447-2 (Original work published 1988)