DIFFER

A. C. Bronneberg

First name
A.
Middle name
C.
Last name
Bronneberg
ORCID
0000-0001-6165-1737
Bieberle-Hütter, A. ., Bronneberg, A. C., George, K. ., & van de Sanden, M. M. (2021). Operando Attenuated Total Reflection Fourier-transform Infrared (ATR-FTIR) Spectroscopy for Water Splitting. Journal of Physics D: Applied Physics, 54(13), 133001. https://doi.org/10.1088/1361-6463/abd435
Bronneberg, A. C., Kang, X. ., Palmans, J. ., Janssen, P. H. J., Lorne, T. ., Creatore, M. ., & van de Sanden, M. C. M. (2013). Direct ion flux measurements at high-pressure-depletion conditions for microcrystalline silicon deposition. Journal of Applied Physics, 114(6), 063305. https://doi.org/10.1063/1.4817859
Bronneberg, A. C., van de Sanden, M. C. M., & Creatore, M. . (2012). Remote plasma deposition of microcrystalline silicon thin-films: Film structure and the role of atomic hydrogen. Journal of Non-Crystalline Solids, 358(2), 379-386. https://doi.org/10.1016/j.jnoncrysol.2011.10.005 (Original work published 2025)
Bronneberg, A. C., Cankoy, N. ., van de Sanden, M. C. M., & Creatore, M. . (2012). Ion-induced effects on grain boundaries and a-Si:H tissue quality in microcrystalline silicon films. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 30, 061512.
Bronneberg, A. C., Smets, A. H. M., Creatore, M. ., & van de Sanden, M. C. M. (2011). On the oxidation mechanism of microcrystalline silicon thin films studied by Fourier transform infrared spectroscopy. Journal of Non-Crystalline Solids, 357(3), 884-887. https://doi.org/10.1016/j.jnoncrysol.2010.11.001 (Original work published 2025)