DIFFER

C. Bruineman

First name
C.
Last name
Bruineman
Bijkerk, F. ., Alonso van der Westen, S. ., Bruineman, C. ., Huiting, R. ., de Bruijn, R. ., Stuik, R. ., & Bakshi, V. . (2006). Flying Circus EUV Source Metrology and Source Development Assessment. In EUV Sources for Lithography (pp. 721-734). Bellingham: SPIE.
Bijkerk, F. ., Shmaenok, L. A., Louis, E. ., Voorma, H. J., Koster, N. B., Bruineman, C. ., … Salashchenko, N. N. (1996). Extreme UV lithography: A new laser plasma target concept and fabrication of multilayer reflection masks. Microelectronic Engineering, 30, 183-186. https://doi.org/10.1016/0167-9317(95)00222-7 (Original work published 2025)