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Design of an Extended Image Field Soft-X-Ray Projection System

Author
Abstract

A soft-x-ray projection system has been designed, which consists of spherical components to be coated with multilayer reflection coatings. In the design, a two-mirror system and a spherical reflection mask, the optical aberrations were minimized. The design enables a resolution of sub-100 nm over a circular image field with a diameter of 4 mm at a wavelength of 10.5 nm. The assembly tolerances of the system and the fabrication tolerances of the substrates have been calculated. The surface roughness determined from our superpolished quartz substrates amounts to 0.3 nm, which is sufficient to meet the required specifications.

Year of Publication
1992
Journal
Microelectronic Engineering
Volume
17
Number
1-4
Number of Pages
145-148
Date Published
Mar
ISBN Number
0167-9317
DOI
10.1016/0167-9317(92)90029-q
PId
bfabb8d18aaab4614b2f2c7ea418f293
Journal Article
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