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Far-Infrared Picosecond Time-Resolved Measurement of the Free-Induction Decay in Gaas-Si

Label Value
Author
P. C. M. Planken
P. C. van Son
J. N. Hovenier
T. O. Klaassen
W. T. Wenckebach
B. N. Murdin
G. M.H. Knippels
Year of Publication
1995
Journal
Physical Review B
Volume
51
Number
15
Number of Pages
9643-9647
Date Published
04/1995
ISBN Number
0163-1829
DOI
10.1103/PhysRevB.51.9643
PId
f2508c47c9c63fcf60dcbdc050335a44
Journal Article
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Citation
Planken, P. C. M., van Son, P. C., Hovenier, J. N., Klaassen, T. O., Wenckebach, W. T., Murdin, B. N., & Knippels, G. M. (1995). Far-Infrared Picosecond Time-Resolved Measurement of the Free-Induction Decay in Gaas-Si. Physical Review B, 51, 9643-9647. https://doi.org/10.1103/PhysRevB.51.9643 (Original work published 1995)